Add foreign plots - the toolbar button

During the thermal qualification and analysis of semiconductor device packages there is a common need to compare measurement results (and descriptive functions derived from measurements) carried out e.g. under different conditions, like the four DCP setups according to the DELPHI methodology. To facilitate such comparisons the add foreign plots function has been implemented in T3Ster-Master: once a certain function plot view of a T3Ster project is visible, the same kind of function curves from other open projects can be added to the base plot

a.)

b.)

Figure 4-36: Selecting foreign plots from other projects to add to the active plot window

This option is available through the toolbar button or via the Add/Remove foreign plot(s) item of the Manipulate menu.

When activated, the Add Foreign Plots window pops up. On the right there is a list of all open projects from which the corresponding function plots can be added to the current one. On the left there is the list of already added foreign plots (Figure 4-36a). Selected items can be moved by the << and >> buttons from one list to the other. Items can be selected as usual in Windows (see Figure 4-36b): << adds foreign plots to the actual plot window >> removes the foreign plots.

Figure 4-28 shows the differential structure functions of an IC package corresponding to the four DELPHI DCP setups (H67: DCP1, H73: DCP2, H78: DCP3 and H87: DCP4).

Figure 4-37: Differential structure functions of four DCP measurements of an IC package - added to the same plot (plot window copy through the Windows clipboard)

Figure 4-38: Moving a function plot - the plot window was combined from structure functions identified for three different DCP measurements of an IC package