MicReD has developed a high performance thermal transient testing system, partially based on a successful design for thermal transient testing developed at the Technical University of Budapest in the late nineties. The main hardware element of this system is the appliance named T3Ster®, an abbreviation for the Thermal Transient Tester.
Figure 1-1: The T3Ster Main System Unit with hardware add-on options and a laptop computer running the standard T3Ster-software
T3Ster® is a unique equipment for performing thermal measurements on semiconductor devices like ICs, transistors, diodes etc. T3Ster® is most suitable for analyzing their thermal behavior, evaluating packages and device mounting, and detecting defects.
T3Ster® is a computer controlled equipment that can be used along with a PC hosting a special control and evaluation software, see Figure 1-1. The standard software1 as a mandatory part of a T3Ster® configuration is capable of applying programmed thermal excitations, and recording complex thermal responses and provides built-in results evaluation procedures. Results of these post-processing procedures include the pulse thermal resistance diagram, time-constant spectrum, complex locus of the thermal impedance, differential and integral structure or profile function.
This manual describes an additional software tool2 called T3Ster-Master that provides similar thermal transient results evaluation procedures as the standard T3Ster software. Data formats of T3Ster-Master are compatible with that of the standard T3Ster software. T3Ster-Master provides lots of options for further manipulation or mastering of the results as well as an import wizard for loading thermal transient curves from almost any foreign source.
For update information on the T3Ster® equipment and related parts refer to
http://www.micred.com/t3ster.html
1 Description of the standard
T3Ster-software is provided in the T3Ster Measurement Control Reference Guide.
2 This manual describes the T3Ster-Master
software version 1.0 as of April 2003.
