General procedure

The general way of calibration is summarized below as follows:
- The basic concept of calibration is measuring the voltage across the sensor
device at two different temperatures. The sensitivity coefficient is usually
measured in [mV/K] units and can be derived as voltage difference/temperature
difference. The JEDEC standard defines an inverse K factor for sensitivity,
measured in [K/mV].
- It is a good practice to measure the two points near to the ends of the
temperature range that will be used and to measure one or two additional points
inside for checking whether the calculated sensitivity value is correct. Calculating
a correct regression is even better.
- The sensitivity depends on the operating point where the device is used.
For achieving low noise and smooth curves the T3Ster®
transient measurement is 'on-line', the current is not switched off for the
measurement time. This means, the calibration has to occur at the operating
current, which can be sometimes high. For details, see the actual cases below.
- The easiest way to measure device sensitivity is using the
T3Ster thermostat unit (see section 7.4). If
this device is installed the only thing you have to do is setting a proper
current through the device in the Set
Measurement Parameters
menu and then selecting Auto
thcoeff measurement
in the Thermostat
menu of the T3Ster software. The calibration process will be carried
out automatically in the given temperature range and the result will be presented
in the form as shown in Figure 7-6. The measured
sensitivity value will be automatically fed into the appropriate input field
of the Channel
Attributes window (see Figure 7-3).
- You may also use some general sensitivity values known from
literature instead of really measuring it (1-2 mV/K for p-n junctions, depending
on the current density). Then you will have measured curves, which are scaled
in some quasi-temperature so giving a good approximate picture. You can also
measure the actual sensitivity later. You can get then correct temperature
values then by editing the sensitivity value in the .par
and .raw/.rec files (see T3Ster
Measurement Control and Evaluation Tool User's Manual, Appendix
A .) and re-evaluating the project. Low power levels should be used at
the measurement in case you do not know the actual sensitivity because you
may destroy the devices by excessive power if you are not aware that maximum
temperature values (120 - 150 °C for silicon devices) have been reached.