T3Ster® completed with its wide range of add-on options provides
flexibility in your daily thermal measurement and characterization
work: automated device calibration with MicReD's dry thermostat and a couple of supported liquid-cooled
thermostats, easy connection of any type of thermocouples through the appropriate preamplifiers,
increased level of switched power with the the different booster options and many more... |
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| Extension box for T3Ster® |
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This unit was designed to multiply the power driver
channels of the T3Ster® equipment
from 1 to 4 or to 7. Housed in the same type of enclosure as the Main
System Unit this unit provides additional power switching modules
and sensor current sources.
The extension boxes are connected to the Main System Unit via the
SPI port of the new USB interface card. |
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| MAIN PROPERTIES |
| Max. number of power driver units: |
3/box |
| Max. number of sensor current
sources: |
12/box |
| Max. current load
of a power driver unit: |
2 A |
| Total allowed current load/box: |
5
A |
| Interface: |
2
SPI ports |
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| Up to two extension
boxes can be installed |
| Switching modes: current step or voltage step |
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The extension box can be well placed on top of the
Main System Unit. The digital control of the extension
box is provided by a simple cable connection to SPI
port of the USB card of the Main System Unit. Up to
two extension boxes can be connected - the second extension
box connects to any of the SPI ports of the first extension
box.
The measurement control program automatically detects
all installed extension boxes and the installed power
driver units and provides the necessary control interface. |
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The main benefit of
having T3Ster® extension boxes
is to allow measurement setups where multiple junctions need to be
driven in order to achieve a full thermal characterization of the
device under test. These include multi-chip module, stacked-die
package applications as well as measurement of power LED assemblies with multiple light sources. |
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The thermostat module of the T3Ster® software provides automatic temperature excursion and calculation
of the sensitivity parameter of diode or resistance sensors. |
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This Peltier-cell cooled, dry thermostat is designed
mainly for the calibration of temperature sensing semiconductor structures
in the devices under test. It is directly controlled by the measurement
software and can be used as single side cold plate as well. |
| MAIN PROPERTIES |
| Temperature range: |
5..90
°C |
| Accuracy: |
±0.2
°C |
| Power sinking capability: |
min. 8 W |
(above
30 °C) |
| Overheating protection |
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These add-on devices have the same excellent speed and resolution as the T3Ster® base unit but raise the switched current, voltage and power level.
The booster devices are modular, ensuring easy extension of the driving capability into tens and hundreds of amperes, and tens and hundreds of volts.
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T3Ster® Booster,
high current model |
The figure of merit value (defined as maximum switched power / temperature resolution) grows to approximately 100 000 W/°C to 1 000 000 W/°C with different booster devices.
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T3Ster® Booster,
high voltage model
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Typical applications of the booster include:
- measurement of power devices such as thyristors or IGBTs,
- measurement of power LED assemblies, LED lines,
- measurement of large area VLSI chips using the substrate diode.
The booster follows the multi-channel architecture of T3Ster®.
Up to four boosting channels can be placed into a single (19 inch, 3U high) enclosure.
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Typical module specifications are: |
| Low voltage module (for diode and thyristor testing): |
- 30V 50A or 15V 100A.
- More channels can be used for simultaneous driving of different colors, etc.
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| High voltage module (for power LED line testing): |
- 60V 25A or 150V 10A.
- More channels can be used for simultaneous driving of different colors, etc.
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Three pole module |
| - for high power IGBT or transistor testing: voltage jump or current jump, 2 kW or more |
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| Booster units have their own control through USB interface. They can be programmed for stand-alone power cycling while T3Ster® is used for
other measurements. |
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| Accelerated measurement
channels |
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There are semiconductor devices which are electrically slower than
thermally. That is, when switching e.g. off, huge amount of diffusion
charges needs to be pulled out. While this electrical transient takes
place, much of the early transients also pass off. The two are superimposed
in the signal grabbed by the measurement channels. In case of some
power LED-s for example, this parasitic effect vanishes only at around
40-50 µs. An advanced realization of the first stage of the
measurement channel helps getting rid off the parasitic electrical
transients about 3 times faster than in the standard measurement cards. |
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- Plug-in compatible with the standard
ones
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- 3 times speeding up electrical
transients of DUT
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- Resulting
structure functions have more details
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The benefit of
installing an accelerated measurement card in a T3Ster® equipment is that the small time-constant region of the thermal transients
is more accurately grabbed. This results in a much better resolution
of structure functions in the inside package regions of the junction-to-ambient
heat conduction path. |
Using accelerated measurement cards is of great importance in die
attach failure analysis applications as well as in heat-flow-path
exploitation of power LEDs.
Standard measurement channels can be upgraded to accelerated ones:
MicReD simply replaces the measurement cards for you. This service
is provided free of charge for customers having a valid maintenance
agreement for their T3Ster® configuration. |
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| Thermocouple
pre-amplifiers |
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Thermocouple pre-amplifiers are provided for an easy interfacing
of J, K or T type thermocouples to the Main System Unit. The amplifiers
have a cold point compensation and provide an output voltage range
matched to the measurement channels of T3Ster®.
The power supply of the amplifiers is provided from the Main System
Unit through the measurement channel connectors. |
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| Thermocouple types: J,
K and T |
| Output voltage: 100
mV at 25°C |
| Sensitivity: 4
mV/°C ±1% |
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There are three types of amplifiers provided for the
J, K and T type thermocouples. In the Channel Attributes window
of the T3Ster software the sensor type (J, K or T) is to be selected
and the sensitivity is to be set to 4mV/°C at the measuring channel
in use. |
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| Standard accessories
and options |
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The Main System Unit is shipped with a PC interface
factory-installed which is now USB. The USB B plug is located in
the front panel of the Main System Unit, on the digital control card. |
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Every T3Ster® configuration
is shipped with a standard accessory kit. This kit includes demo
adaptors with demo devices: a diode adaptor - making the 4 wire connections
easy, an adaptor for 3-pole devices (BJT-s or MOSFET-s) and an adaptor
for thermal test chips with a resistive heater and a diode type sensor.
These adaptors are for demo purposes and they serve as example for users to make their own adaptors. MicReD does not guarantee that during long-term use contact problems will not occur. Instead of applying screw joints we suggest using soldered connections. |
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The latest release of the measurement control software
supports this option. Older T3Ster® configurations
with LPT interface or with MicReD's proprietary ISA-slot interface
card can be upgraded to this USB option. This service is provided
free of charge for customers having a valid maintenance
agreement for their T3Ster® configuration or order an extension box. |
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| JEDEC standard
still-air chamber & JEDEC standard test boards |
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MicReD offers a still-air chamber (1 ft3)
to assure JEDEC JESD51-2 compliant setup for thermal transient measurements
in a natural convection environment. The chamber can be easily adjusted
to any JEDEC standard thermal test board size and to any edge connector
type. Users are to realize the connection between the JEDEC board and the instrument but MicReD provides an edge connector and cable as an example.
These accessories are needed for junction-to-ambient thermal resistance (thermal impedance) measurements that comply
to the JEDEC JESD51 standards. Keeping all the essential elements
of the standard procedure, the transient test method can be used
to speed up the measurements and besides a single, lumped Rthja value it allows exploring all details of the entire junction-to-ambient
heat-flow path with the help of the structure
functions.
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Junction-to-case measurements can be easily
realized with the transient test method and
the structure functions.
Consult our central laboratory for details. We are happy to advise
you what fixtures and what measurement procedure needs to be applied
for a junction-to-case measurement using the T3Ster® equipment that is superior in repeatability and in speed
compared to other companies' solutions.
Although the transient test method for junction-to-case
measurements is still just on the standardization roadmap of the
JEDEC JC15.1 committee, it is becoming a de
facto industrial standard due to its ease of use. |
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| TERALED - special set of accessories for power LED-s |
In case of power LED-s (1..5 W range) significant amount (cca.
25-30%) of supplied electrical power is converted to light. Thus,
when thermal characterization is such LED-s is performed by the
electrical test method, the emitted energy has to be also measured.
This necessitates the combined ThErmal
and RAdiometric measurement
of power LED-s. MicReD has realized this fact and in cooperation with Inphora Inc. launched a development
project aiming to provide the appropriate set of measurement
tools. From December 2005 on, the TERALED setup is available. Orders can be placed either at MicReD or
at Inphora. |
The TERALED setup includes the following: |
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an integrating sphere for the radiometric and/or photometric
measurements, |
a temperature controlled LED fixture for the DUT (up
to a sample size of 40x40 mm and a dissipation level
of up to 10 W), |
high precision, temperature stabilized radiometric
and photometric detectors, |
temperature and current stabilized reference LED(s), |
control and interface electronics, |
and a T3Ster® equipment
and measurement control software. |
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The complete TERALED system is available
now. If you are interested in this measurement option, we are happy
if you contact us,
also to discuss what customization options can we provide for your
specific needs. |
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| Other options
and services |
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On top of the available measurement hardware add-on options MicReD
offers a number of other options related to its T3Ster® product line. These include: |
- A carry-bag made of synthetic
fabric to allow an easy moving around the Main System Unit.
This option is very useful if you use T3Ster® with USB interface option and a notebook computer is used for
the measurement control. A special flight-case is also available that allows safe and easy carriage when flying.
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- MicReD provides initial on-site setup
and tuition for new T3Ster® users.
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- MicReD takes a one year parts warranty for T3Ster®.
Further service can be purchased in the frame of a maintenance
agreement. Besides extended warranty for the hardware
this agreement provides you free access to any new version of
the T3Stermeasurement control and evaluation software.
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- If you do not prefer a maintenance agreement, we also offer field services and software
upgrades on individual basis.
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We also provide consulting
and parts measurement services. If you are interested,
please contact our central laboratory. |
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