Thermal measurements and qualification using
the transient method: principles and applications by A. Poppe |
| The tutorial covers advanced topics selected from the field thermal
measurement of microelectronic structures and MEMS devices and some
other types of measurements using the so called transient method.
The transient method is based on capturing the real-time thermal transients
completed with sophisticated mathematical algorithms to evaluate the
measurement results. The evaluation procedure discussed in details
is the NID method (network identification by deconvolution). The tutorial
will “de-mystify” the famous structure functions –
through practical examples it will be shown how they are used in real
applications.
The tutorial would include, but will not be limited to the following
topics:
- Thermal transient testing: measurement methods and available
tools.
- Evaluation of thermal transients (heating/cooling curves) by
the NID method:
- time-constant spectra,
- structure functions,
- RC models derived from transient curves.
- Structure functions as models of the physical structure.
- Using structure functions for heat-flow path reconstruction
and for modeling purposes
- Principles of structure function based thermal property measurements
and some application examples such as
- TIM characterization
- Principles of RthJC measurements with the transient method
- Non-destructive structure analysis: advanced case studies
(e.g. investigation of state-of-the-art stacked die packages,
study of high power LED-s)
- How to account for heat-losses via parallel heat-flow paths
when using the structure function based methods.
The theoretical part of the tutorial will be completed with practical
examples and hands-on demonstration.
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